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Germany - Miscellaneous machines and apparatus for special purposes - Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W

Original Deutschland - Diverse Maschinen und Geräte für besondere Zwecke - Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W

Closed Contract notice

Key facts

Closed
Buyer
Fraunhofer-Gesellschaft, Einkauf B12
Where
Germany Freiburg
Procedure
Open procedure Anyone may submit a bid, in one step, with no pre-selection. Full entry Above the EU threshold A contract large enough that EU-wide rules apply and it must be published on TED. Full entry
CPV code The EU's common vocabulary for what is being bought: an eight-digit code every notice carries. Full entry
42990000 Miscellaneous special-purpose machinery
Original language
German
Source
via TED - Tenders Electronic Daily (Publications Office of the EU), verified 1 month ago
Notice number
583241-2026
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  1. Published
  2. Deadline open for 30 days
  3. Awarded pending

Summary

Machine-generated summary

Fraunhofer IAF in Germany intends to procure one secondary ion mass spectrometer (SIMS). The instrument must enable highly sensitive, depth-resolved chemical analysis of semiconductor materials and structures, with high depth resolution and high mass resolving power. It will be used for precise dopant and impurity profiling, accurate determination of layer thickness and homogeneity, and characterization of advanced III-V and diamond-based device structures and epitaxial layers, including 150 mm substrates, supporting process development, quality control and optimization. Interested suppliers should consult the official tender documents for requirements and submission conditions.

Description

Secondary ion mass spectrometer (SIMS) 1 pc. The objective is to procure a highly sensitive SIMS instrument for depth-profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolving power. The system shall enable precise dopant and impurity profiling, as well as accurate determination of layer thickness and homogeneity, with a focus on characterizing advanced III-V and diamond-based device structures and epitaxial layers, including 150 mm substrates, to support process development, quality control and optimization at Fraunhofer IAF.

Official source

Source: TED - Tenders Electronic Daily (Publications Office of the EU)

Always verify details on the official notice.

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Last verified against TED - Tenders Electronic Daily (Publications Office of the EU) 1 month ago

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Avg. open tender · Industrial machinery
€1,709,730
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Buyer track record on Aperlena
136 notices tracked · 68 awarded

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