Description
The subject of this tender is a low-temperature (<3K), ultrahigh vacuum (UHV) scanning probe microscopy system with optical access to the scanned sample to pinpoint device structures in the sub-micrometer range to be investigated on the atomic level. The system provides state-of-the-art scanning tunneling microscopy (STM), spectroscopy (STS) and tuning fork based noncontact atomic force microscopy (nc-AFM), including UHV preparation chamber and load lock.
Official source
Source: TED - Tenders Electronic Daily (Publications Office of the EU)
Always verify details on the official notice.
Last verified against TED - Tenders Electronic Daily (Publications Office of the EU) 1 month ago
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Market context
- Avg. open tender · Laboratory & precision equipment
- €5,721,969
- Buyer track record on Aperlena
- 5 notices tracked · 2 awarded
- €1,397,735 in awarded contracts
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