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Germany - Surface measuring devices - High resolution nano-XCT system

Original Deutschland - Oberflächen-Messgeräte - High resolution nano-XCT system

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  1. Published
  2. Deadline open for 30 days
  3. Awarded pending

Summary

Machine-generated summary

The Fraunhofer Institute for Microstructure of Materials and Systems IMWS in Germany is procuring a high-resolution nano-XCT system, a state-of-the-art radiography (2D) and X-ray tomography (3D-CT) tool for non-destructive failure analysis of highly integrated 2.5D/3D electronic components. The supply includes a complete functional device with assembly, commissioning, connections, approvals, certifications, operating software and a high-performance multi-processor workstation for postprocessing imaging data. No estimated value, deadline or procedure details are stated in the notice.

Description

The Fraunhofer Institute for Microstructure of Materials and Systems IMWS researches the application behaviour, reliability, safety and lifetime of innovative materials in components and systems. The Business Unit “Electronic Materials and Components” Fraunhofer IMWS support industry and research partners by its internationally recognized expertise in failure analyses of electronic components. Fraunhofer IMWS will enhance its capabilities for advanced failure analysis and material characterization to support the ramp up of new heterogenous integration technologies addressing the manufacturing and reliability challenges. To enable the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics, the latest generation of radiography (2D) and X-ray tomography (3D-CT) systems are required in particular for the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics. A high-performance multi-processor workstation is required for postprocessing of the generated imaging data sets to identify tiny deviations and defects within the devices. This tender is for the supply a functional complete device including assembly, commissioning and all necessary connections, approvals/certifications and software for operation. The requirements for a state-of-the-art x-ray inspection tool for highly integrated 2.5/3D components are described below:

Official source

Source: TED - Tenders Electronic Daily (Publications Office of the EU)

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Last verified against TED - Tenders Electronic Daily (Publications Office of the EU) 1 month ago

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    • Submission deadline: Extended by 1 day: now September 4, 2026, 10:00

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Market context

Avg. open tender · Laboratory & precision equipment
€5,662,366
2,298 open across Europe right now
Buyer track record on Aperlena
49 notices tracked · 23 awarded
€2,953,907 in awarded contracts

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