Summary
Machine-generated summaryFraunhofer EMFT in Germany is procuring a wafer prober system for post-silicon verification, characterization and functional test of integrated circuits and chiplets. The system must handle 200mm and 300mm wafers and also wafers mounted on a dicing frame (frame prober function), allowing flexible use for different analysis and test situations. It will be coupled with an automated test system (ATE). Interested suppliers should follow the referenced procurement procedure and monitor the official tender documents for deadlines and participation requirements.
Description
Official source
Source: TED - Tenders Electronic Daily (Publications Office of the EU)
Always verify details on the official notice.
Last verified against TED - Tenders Electronic Daily (Publications Office of the EU) 1 month ago
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- Avg. open tender · Electrical machinery
- €54,506,248
- Buyer track record on Aperlena
- 136 notices tracked · 68 awarded
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