Summary
Machine-generated summaryThe buyer is procuring an X-ray diffraction (XRD) instrument for research and development and for characterising materials used in microelectronics and microsystems. The equipment must allow non-destructive analysis of a wide range of materials (thin films, powders, nanostructures, liquid suspensions, membranes) to determine crystalline structure and microstructural parameters, supporting phase identification, Rietveld refinement, reflectivity measurements, reciprocal space mapping and residual stress determination. It will be part of a 'Microfabrication of semiconductor devices' prototyping line under the PNTS project, the 'National Semiconductor Technologies Platform', in Romania. Requirements include high-resolution measurements, flexible experimental configurations, detection systems, analysis software and safe operation mechanisms. The estimated value, submission deadline and procedure details are not stated in the available description.
Description
Official source
Source: TED - Tenders Electronic Daily (Publications Office of the EU)
Always verify details on the official notice.
Last verified against TED - Tenders Electronic Daily (Publications Office of the EU) 3 weeks ago
More from this buyer
Full buyer profileWho usually wins this buyer's contracts in this sector
| Company | Wins | Total awarded | Last win |
|---|---|---|---|
| JEOL (EUROPE) SAS | 1 | €2.1M | Feb 2026 |
| APEL LASER | 1 | €413,255 | May 2026 |
Based on 2 awards with a linked company profile over the last 5 years.
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Market context
- Avg. open tender · Laboratory & precision equipment
- €5,546,123
- Buyer track record on Aperlena
- 11 notices tracked · 4 awarded
- €3,594,473 in awarded contracts
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